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Polska wersja

Polska wersja

 

General information

         Division of Medical Physics emerged by the Świętokrzyska Academy Rector's     decision from 2003 r. A head of the division is Prof. Janusz Braziewicz.

     Research work in Division of Medical Physics is being developed along:

1. Use of X-ray spectroscopy in investigation concentration of vestigial elements

  • Investigations are led using X-ray lamp and additional equipment to X-ray Fluorescence Spectroscopy (XRF) and Total Reflection X-ray Fluorescence Spectroscopy (TXRF). These methods permit to define concentration of vertigial elements on level ppm-ppb. Main works executed in division concern interdisciplinary questions. These methods were used to examinations of wooden sculptures from the Altar of Veit Strass in Cracow, Poland or to define technological process of Celtic articles on terrain of Poland and for monitoring process of production of crystals applied in microelectronics and optoelectronics.

2. Imaging techniques in medical diagnostics

  • Investigations of new solution in imaging techniques applied in medical diagnosis and therapy - its a second area of examinations. The result of this activity were worked out new diagnostic procedures applied in planning treatment and dosimetric procedures applied in therapy of tumours using photons and electrons. Results of these investigations were used in the medical phisicist's routine activity both in Holycross Center of Cancer and in different oncological posts in Poland. Techniques applied in positron emission tomography and nuclear medicine are the new direction of examinations.

3. Biological influence of radiation about high LET

  • The investigations of genetic changes in result of passage of heavy ion about linear transfer of energy ~1MeV/µm - its third area of examinations.

     The Division is equipped with:

  • X-ray lamp (Siemens 3 kW, 60 kV),
  • X-ray detector Si(Li),
  • low-background spectrometer of g radiation Ge(Li),
  • X-ray microbeam system.

Arrangement to X-ray fluorescent analysis (methods TXRF and XRF)

    

Last modified: 2018-06-12
Webmaster: Dr. Sc. Janusz Braziewicz